Presentation type: Oral

Session No. O13-2
Session Name: Instruments and Techniques III
Title: Wavefield reconstruction using structured electron beams
Presenter: Hirokazu Tamaki
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Presentation type: Invited Speech

Session No. O13-1
Session Name: Instruments and Techniques III
Title: Channel strain measurement between Si / Ge stressors of tri-gate field-effect transistor using moiré fringes appeared in scanning transmission microscopy
Presenter: Dr. Yukihito Kondo
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