| Wednesday, June 6 | | |
| | Registration
On-site Reception | 15:10 - 18:00 |
| Thursday, June 7 | | |
| Breakfast | 7:40 - 8:25 |
| Opening | Di-Jing Huang | 8:25 - 8:30 |
Session I
8:30-10:10
Ex-situ Metrology I Chairperson: Mourad Idir | Francois POLACK
Pushing the Accuracy of Surface Shape Determination with Stitching Methods | 8:30 - 8:55 |
Frank Siewert
On the characterization of a 1 meter long, ultra-precise KB-focusing mirror pair for European XFEL by means of slope measuring deflectometry | 8:55 - 9:20 |
Haruhiko Ohashi
Effective protocol for realizing contamination-free x-ray optics | 9:20 - 9:45 |
Amparo VIVO
Stitching techniques for measuring X-ray synchrotron mirror topography | 9:45 - 10:10 |
| Break | 10:10 - 10:40 |
Session II
10:40-12:00
Fabrication and Finishing Technologies for X-ray Mirrors
Chairperson: Gung-Chian Yin
| Takato Inoue
Fabrication of ultraprecise multilayer focusing mirrors using an X-ray grating interferometer and differential deposition technique | 10:40 - 11:00 |
Jumpei Yamada
Development of reflective imaging optics using concave and convex mirrors | 11:00 - 11:20 |
Hidekazu Mimura
Fabrication of a precise ellipsoidal mirror for soft X-ray nanofocusing | 11:20 - 11:40 |
Muriel Thomasset
15 years of grating metrology for X-ray and V-UV synchrotron beamlines. | 11:40 - 12:00 |
| Lunch/Poster | 12:00 - 13:30 |
Session III
13:30-14:35
Active/Adaptive and Zoom Optics & Optics Developments
Chairperson: Haruhiko Ohashi | Simon G. Alcock
Rapidly varying the size and shape of X-ray beams using high speed, bimorph deformable mirrors | 13:30 - 13:55 |
Hiroki Nakamori
Development of adaptive Kirkpatrick-Baez mirrors based on bimorph and mechanical bending | 13:55 - 14:15 |
Hok-Sum Fung
High Accuracy Measurement of an Active Grating Surface Figure Controlled by a Twenty-Five-Actuator Bender | 14:15 - 14:35 |
| | Break
Group Photo | 14:35 - 15:40 |
Session IV
15:40-17:45
Ex-situ Metrology II
Chairperson: Raymond Barrett | Ming Li
Performance of the Flag-type Surface Profiler in HEPS | 15:40 - 16:05 |
Valeriy V Yashchuk
Ex situ metrology of aspherical pre-shaped x-ray mirrors at the Advanced Light Source | 16:05 - 16:30 |
Josep Nicolas
Measurement completeness for stitching surface reconstruction | 16:30 - 16:55 |
Gerd Ehret
Improvements of the small-angle deflectometer at PTB for form measurement of large flat optics | 16:55 - 17:15 |
Uwe Flechsig
The new LTP-1400 @SLS - performance measurements and features | 17:15 - 17:35 |
| Sponsor talk: ZYGO TBA | 17:35 - 17:45 |
| Banquet
Giovanni Sostero Award | 18:20 |
| Friday, June 8 | | |
| Breakfast | 7:40 - 8:30 |
Session V
8:30-10:10
Ex-situ Metrology III
Chairperson: Valeriy V Yashchuk | Bharath Reddy Adapa
Stitching Shack Hartmann Wavefront Sensor (SHARPeR) | 8:30 - 8:50 |
May Ling Ng
The LCLS Optics Metrology Laboratory: The Mission and Projects | 8:50 - 9:10 |
Bernd Meyer
Commissioning of the LNLS Long Trace Profiler (LTP VI) | 9:10 - 9:30 |
Hirokatsu Yumoto
Zero-method scanning-probe profilometer for high-precision aspherical X-ray mirrors with highly-sloped surface | 9:30 AM - 9:50 |
Ralf D. Geckeler
Environmental influences on autocollimator-based deflectometric form measurement of beamline optics | 9:50 - 10:10 |
| Break | 10:10 - 10:40 |
Session VI
10:40-12:20
Metrology Applications
Chairperson: Frank Siewert | Lorenzo Raimondi
Optical systems: from metrology characterization to WFS analysis, through WISEr simulations | 10:40 - 11:05 |
Duan-Jen Wang
Metrology for the TPS beamline optical components | 11:05 - 11:30 |
Maurizio Vannoni
Installation and commissioning of European XFEL beam transport SASE1 and SASE3 beamlines from a metrology point of view | 11:30 - 11:55 |
Lei HUANG
One-dimensional angular-measurement-based stitching interferometry | 11:55 - 12:20 |
| Lunch/Poster | 12:20 - 13:30 |
Session VII
13:30-15:10
In-situ Metrology & Optics Developments
Chairperson: Ming Li | Vivek G. Badami
In-Situ Metrology for Adaptive X-Ray Optics With An Absolute Distance Measuring Sensor | 13:30 - 13:50 |
Shang-Wei Lin
Application of in situ long trace profiler at NSRRC | 13:50 - 14:10 |
Hongchang Wang
Advanced metrology of X-ray mirrors with speckle wavefront sensing technique | 14:10 - 14:30 |
Qiushi Huang
Deposition and metrology of high precision X-ray mirrors for advanced light source | 14:30 - 14:50 |
Vadim Burwitz
Developing, Testing, and Calibration of Optics for Future X-ray Space Observatories at PANTER | 14:50 - 15:10 |
| | Break
Group Photo | 15:10 - 15:40 |
Session VIII
15:40-17:35
X-ray Beam Wavefront Measurement and Characterization
Chairperson: Kawal Sawhney
| Elke Ploenjes
Characterization of a KB focusing system at the soft X-ray free-electron laser FLASH2 | 15:40 - 16:05 |
Michele Manfredda
Investigating FEL sources: a joint approach of Wavefront sensing, Metrology characterization, and WISEr simulations. | 16:05 - 16:25 |
Walan Grizolli
Non-invasive wavefront sensor for hard x-ray beamlines | 16:25 - 16:45 |
Xianbo Shi
Measurement of vibration effects on X-ray beam coherence | 16:45 - 17:05 |
Silja Schmidtchen
MooNpics Preparation for a round-robin metrology project | 17:05 - 17:25 |
| Sponsor talk: Imagine Optic TBA | 17:25 - 17:35 |
| Dinner | 18:20 |
| Saturday, June 9 | | |
| Breakfast | 7:40 - 8:30 |
Session IX
8:30-9:10
Ex-situ Metrology IV
Chairperson: Duan-Jen Wang | Frank Scholze
Multi-method metrology for layered and structured surfaces | 8:30 - 8:50 |
Ian Lacey
Optimization of size and shape of aperture in autocollimator-based deflectometric profilometers | 8:50 - 9:10 |
Closing Remarks
Chairperson: Maurizio Vannoni | | 9:10 - 10:00 |
| TPS tour | | 10:00 - 11:00 |
| Adjourn | | 11:30 |